Core Facilities: Microscopy

Atomic Force Microscope

Powerful tool used to measure properties of a sample surface. Such properties include roughness, height and depth.

FTIR

The FTIR system at the NCBES consists of the FTIR-8300 and the AIM-8800.

Hitachi Scanning Electron Microscope with EDX Analysis System (NCBES)

The Hitachi S-4700 SEM allows high resolution imaging of surfaces.

Hitachi Transmission Electron Microscope (NCBES)

Powerful microscope used to image ultrafine structure.

Inverted Fluorescent Microscope

The inverted fluorescent microscope is used for 2d fluorescent and brightfield imaging of both live and fixed specimens.

THIS MICROSCOPE CAN BE BOOKED USING THE BOOKING SHEET ON THE DOOR TO 305B

Upright Fluorescent/Brightfield Microscope with Improvision Optigrid

The upright fluorescent microscope is used for fluorescent imaging of fixed specimens. The optigrid and volocity software can be used as a Pseudo Confocal for acquiring 3d imaging.